Temperature drift compensation

ABSTRACT

A voltage reference circuit includes a bandgap circuit and a temperature compensation circuit. The temperature compensation circuit includes a first trim circuit, a second trim circuit, and a resistive digital-to-analog converter. The resistive digital-to-analog converter is coupled to the first trim circuit, the second trim circuit, and the bandgap circuit. The resistive digital-to-analog converter is configured to generate a temperature compensation voltage, and to provide the temperature compensation voltage to the bandgap circuit.

CROSS REFERENCE TO RELATED APPLICATIONS

This continuation application claims priority to U.S. patent applicationSer. No. 15/928,395, filed Mar. 22, 2018, which application claimspriority to India Provisional Application No. 201741012623, filed Apr.7, 2017, both of which are hereby incorporated by reference in theirentirety.

BACKGROUND

Various analog circuits, voltage reference circuits for example, sufferfrom offset error. Offset error results from mismatch of circuitcomponents. For example, in an amplifier, mismatch of differential inputtransistors can cause the amplifier to produce a non-zero output voltagewhen the amplifier input voltage is zero. Offset error can detrimentallyaffect the operation of a circuit receiving a signal that includes anoffset voltage.

Attempts are made to minimize offset error in a variety of applications.However, even after compensating for offset error, the factors thatproduce the offset error can vary with temperature, causing a variationin the offset error with temperature. Such variation is referred to as“offset drift.”

SUMMARY

Temperature compensation circuits that correct for offset that changeswith temperature are disclosed herein. In one example, a voltagereference circuit includes a bandgap circuit and a temperaturecompensation circuit. The temperature compensation circuit includes afirst trim circuit, a second trim circuit, and a first resistivedigital-to-analog converter. The resistive digital-to-analog converteris coupled to the first trim circuit, the second trim circuit, and thebandgap circuit. The first resistive digital-to-analog converter isconfigured to generate a temperature compensation voltage, and toprovide the temperature compensation voltage to the bandgap circuit.

In another example, a method for trimming a voltage reference circuitincludes adjusting an output voltage of a bandgap circuit to a referencevoltage at a first temperature. The method also includes generating atemperature compensation voltage to adjust the output voltage as afunction of temperature. The generating includes setting a firstresistive digital-to-analog converter to produce a weighted sum of avoltage proportional to absolute temperature and a voltage complementaryto absolute temperature. The method further includes providing thetemperature compensation voltage to the bandgap circuit to adjust theoutput voltage.

In a further example, a temperature compensation circuit includes abandgap circuit, a proportional to absolute temperature voltagegeneration circuit, a complementary to absolute temperature voltagegeneration circuit, a first resistive digital-to-analog converter, asecond resistive digital-to-analog converter, and a third resistivedigital-to-analog converter. The first resistive digital-to-analogconverter is coupled to an output of the proportional to absolutetemperature voltage generation circuit. The second resistivedigital-to-analog converter is coupled to an output of the complementaryto absolute temperature voltage generation circuit. The third resistivedigital-to-analog converter coupled to an output of the first resistivedigital-to-analog converter, an output the second resistivedigital-to-analog converter, and an input of the bandgap circuit.

BRIEF DESCRIPTION OF THE DRAWINGS

For a detailed description of various examples, reference will now bemade to the accompanying drawings in which:

FIG. 1 shows a block diagram for a voltage reference circuit thatincludes voltage output temperature compensation in accordance with thepresent disclosure;

FIG. 2 shows a schematic diagram of resistive digital-to-analogconverters arranged to provide voltage output temperature compensationin accordance with the present disclosure;

FIG. 3 shows a schematic diagram for a voltage reference circuit thatincludes voltage output temperature compensation implemented within acontrol loop of the bandgap circuit in accordance with the presentdisclosure;

FIG. 4 shows a schematic diagram for a voltage reference circuit thatincludes voltage output temperature compensation implemented external toa control loop of the bandgap circuit in accordance with the presentdisclosure; and

FIG. 5 shows a flow diagram for a method for trimming a voltagereference circuit that that includes voltage output temperaturecompensation in accordance with the present disclosure.

DETAILED DESCRIPTION

Certain terms have been used throughout this description and claims torefer to particular system components. As one skilled in the art willappreciate, different parties may refer to a component by differentnames. This document does not intend to distinguish between componentsthat differ in name but not function. In this disclosure and claims, theterms “including” and “comprising” are used in an open-ended fashion,and thus should be interpreted to mean “including, but not limited to .. . .” Also, the term “couple” or “couples” is intended to mean eitheran indirect or direct wired or wireless connection. Thus, if a firstdevice couples to a second device, that connection may be through adirect connection or through an indirect connection via other devicesand connections. The recitation “based on” is intended to mean “based atleast in part on.” Therefore, if X is based on Y, X may be a function ofY and any number of other factors.

To compensate for offset drift with changing temperature, temperaturecompensation circuits generate a temperature compensation signal thatchanges with temperature and reduces the offset present at the output ofa target device, such as voltage reference circuit. Some temperaturedrift compensation circuits use current output digital-to-analogconverters to set the parameters of the temperature compensation signal.The current output digital-to-analog converters generate flicker noisethat contributes significantly to low frequency noise at the output ofthe compensated device. The low frequency noise is difficult to filterand can detrimentally affect the operation of a receiving circuit. Thenoise can be reduced by increasing power in the current outputdigital-to-analog converters, but increasing power is undesirable in lowpower applications.

The temperature compensation circuits disclosed herein reduce lowfrequency noise while maintaining low power consumption. The temperaturecompensation circuits of the present disclosure reduce low frequencynoise by providing a temperature compensation voltage rather than atemperature compensation current. In implementations of a temperaturecompensation circuit, voltage output digital-to-analog converters,rather than current output digital-to-analog converters, are used togenerate a temperature compensation voltage. The voltage outputdigital-to-analog converters are resistive devices that producesubstantially less low frequency noise than current outputdigital-to-analog converters.

FIG. 1 shows a block diagram for a voltage reference circuit 100 thatincludes voltage output temperature compensation in accordance with thepresent disclosure. The voltage reference circuit 100 includes a bandgapcircuit 102 and a temperature compensation circuit 134. The temperaturecompensation circuit 134 includes a trim circuit 136, a trim circuit138, and a resistive digital-to-analog converter 112. The trim circuit136 includes a proportional-to-absolute-temperature (PTAT) voltagegeneration circuit 104 and a resistive digital-to-analog converter 110.The trim circuit 138 includes a complementary-to-absolute-temperature(CTAT) voltage generation circuit 106 and a resistive digital-to-analogconverter 108. The PTAT voltage generation circuit 104 and the CTATvoltage generation circuit 106 are coupled to an output of the bandgapcircuit 102. The resistive digital-to-analog converter 108 is coupled toan output of the CTAT voltage generation circuit 106. The resistivedigital-to-analog converter 110 is coupled to an output of the PTATvoltage generation circuit 104. The resistive digital-to-analogconverter 112 is coupled to an output of the resistive digital-to-analogconverter 108 and to an output of the resistive digital-to-analogconverter 110. An output of the resistive digital-to-analog converter112 is fed back to the bandgap circuit 102 in some implementations ofthe voltage reference circuit 100 to adjust (e.g., temperaturecompensate) the output of the bandgap circuit 102. In someimplementations of the voltage reference circuit 100 the output of theresistive digital-to-analog converter 112 is not fed back to the bandgapcircuit 102, and is representative of the temperature compensated outputof the voltage reference circuit 100.

The bandgap circuit 102 generates an output voltage that approximatelycorresponds to the bandgap energy of silicon (e.g., about 1.2 volts),and is relatively constant over temperature. That is, the drift overtemperature is relatively small. Some applications require that thetemperature drift be further reduced and the temperature compensationcircuit of the voltage reference circuit 100 operates to reduce thedrift of the output voltage 114 over temperature. During manufacture ofthe voltage reference circuit 100, the output voltage 114 is adjusted toequal a given reference voltage at a selected temperature.

The PTAT voltage generation circuit 104 generates an output voltage 116that is proportional to absolute temperature. The output voltage 116increases with temperature. The output voltage 116 is provided to theresistive digital-to-analog converter 110 as input. During manufactureof the voltage reference circuit 100, the resistive digital-to-analogconverter 110 is set to scale the output voltage 116 such that theoutput voltage 120 of the resistive digital-to-analog converter 110equals the given reference voltage at the selected temperature.

The CTAT voltage generation circuit 106 generates an output voltage 118that is complementary to absolute temperature. The output voltage 118decreases with temperature. The output voltage 118 is provided to theresistive digital-to-analog converter 108 as input. During manufactureof the voltage reference circuit 100, the resistive digital-to-analogconverter 108 is set to scale the output voltage 118 such that theoutput voltage 122 of the resistive digital-to-analog converter 108equals the given reference voltage at the selected temperature.

The output voltage 120 and the output voltage 122 are provided to theresistive digital-to-analog converter 112 as inputs. For example, anoutput terminal 126 of the resistive digital-to-analog converter 110 iscoupled to an input terminal 128 of the resistive digital-to-analogconverter 112, and an output terminal 130 of the resistivedigital-to-analog converter 108 is coupled to an input terminal 132 ofthe resistive digital-to-analog converter 112. The resistivedigital-to-analog converter 112 provides a weighted sum of the outputvoltage 120 and the output voltage 122 to form an output voltage 124 (atemperature compensation voltage). The output voltage 124 varies withtemperature at a rate that compensates for the variance with temperatureof the bandgap voltage generated by the bandgap circuit 102.Accordingly, the bandgap circuit 102 sums the output voltage 124 withthe bandgap voltage generated by the bandgap circuit 102 to produce theoutput voltage 114. Because the resistive digital-to-analog converter108, the resistive digital-to-analog converter 110, and the resistivedigital-to-analog converter 112 are passive, rather than active, the lowfrequency noise produced to scale the output voltage 116 and outputvoltage 118 is reduced relative to current output digital-to-analogconverters. In some implementations of the voltage reference circuit100, the circuit area of the resistive digital-to-analog converter 108,the resistive digital-to-analog converter 110, and the resistivedigital-to-analog converter 112 is less than the circuit area occupiedby current output digital-to-analog converters.

FIG. 2 shows a schematic diagram of the resistive digital-to-analogconverter 108, the resistive digital-to-analog converter 110, and theresistive digital-to-analog converter 112 arranged to provide voltageoutput temperature compensation in accordance with the presentdisclosure. The resistive digital-to-analog converter 108 includes aplurality of resistors 206 connected in series. A tap is provided at aconnection of each pair of resistors 206. Each of the taps provides adifferent scaling of the output voltage 118 received from the CTATvoltage generation circuit 106. While four of the resistors 206 areillustrated in FIG. 2, some implementations of the resistivedigital-to-analog converter 108 may include more than four resistors206.

The resistive digital-to-analog converter 110 includes a plurality ofresistors 202 connected in series. A tap is provided at a connection ofeach pair of resistors 202. Each of the taps provides a differentscaling of the output voltage 116 received from the PTAT voltagegeneration circuit 104. While four of the resistors 202 are illustratedin FIG. 2, some implementations of the resistive digital-to-analogconverter 110 may include more than four resistors 202.

The resistive digital-to-analog converter 112 includes a plurality ofresistors 204 connected in series. A tap is provided at a connection ofeach pair of resistors 204. Each of the taps provides a differentweighting of the output voltage 120 and output voltage 122 received fromthe resistive digital-to-analog converter 110 and the resistivedigital-to-analog converter 108 respectively. Thus, selection of thedifferent taps of the resistive digital-to-analog converter 112 providesa different sum of the output voltage 120 and output voltage 122, whereeach different sum corresponds to a different slope of the outputvoltage 124. While four of the resistors 204 are illustrated in FIG. 2,some implementations of the resistive digital-to-analog converter 112may include more than four resistors 204.

FIG. 3 shows a schematic diagram for a voltage reference circuit 300that includes voltage output temperature compensation implemented withina control loop of the bandgap circuit in accordance with the presentdisclosure. The voltage reference circuit 300 is an implementation ofthe voltage reference circuit 100. The voltage reference circuit 300includes bandgap circuit 302, a PTAT voltage generation circuit 304, aCTAT voltage generation circuit 306, a resistive digital-to-analogconverter 308, a resistive digital-to-analog converter 310, and aresistive digital-to-analog converter 312. The bandgap circuit 302, thePTAT voltage generation circuit 304, the CTAT voltage generation circuit306, the resistive digital-to-analog converter 308, the resistivedigital-to-analog converter 310, and the resistive digital-to-analogconverter 312 are implementations of the bandgap circuit 102, the PTATvoltage generation circuit 104, the CTAT voltage generation circuit 106,the resistive digital-to-analog converter 108, the resistivedigital-to-analog converter 110, and the resistive digital-to-analogconverter 112 respectively.

The bandgap circuit 302 includes a bandgap reference circuit 320, abuffer amplifier 322, and a resistive digital-to-analog converter 326.The bandgap reference circuit 320 generates the bandgap voltage and thebuffer amplifier 322 isolates the bandgap reference circuit 320 from theloading effects of circuits external to the bandgap circuit 302. Theresistive digital-to-analog converter 326 provides for adjustment of theoutput voltage generated by the bandgap reference circuit 320 at aselected temperature. For example, the bandgap reference circuit 320 mayinclude a plurality of resistors connected in series and tap pointsbetween each pair of resistors. A tap point at which the bandgap current336 is provided to the resistive digital-to-analog converter 326 isselected to produce an output voltage 114 that equals a referencevoltage.

The PTAT voltage generation circuit 304 includes one or more transistors328. In the illustrated implementation of the PTAT voltage generationcircuit 304, three transistors 328 are connected as diodes and connectedin series, so that the voltage of the output voltage 116 is about threediode drop voltages lower than the voltage of the output voltage 114.Other implementations of the PTAT voltage generation circuit 304 mayinclude a different number of transistors 328. The output voltage 114 isreceived as input to the transistors 328. A current source 330 couplesthe transistors 328 to ground. The output voltage 116 is provided at anoutput terminal of the transistors 328 coupled to the current source330.

The output voltage 116 generated by the PTAT voltage generation circuit304 is provided to the resistive digital-to-analog converter 310. Theresistive digital-to-analog converter 310 operates as a programmablevoltage divider to generate a scaled version of the output voltage 116.The output voltage 120 generated by the resistive digital-to-analogconverter 310 is provided to the resistive digital-to-analog converter312.

The voltage reference circuit 300 includes a switch 314, a switch 316,and a switch 318 to allow selectable isolation of the resistivedigital-to-analog converter 308, the resistive digital-to-analogconverter 310, and the resistive digital-to-analog converter 312 duringadjustment of the resistive digital-to-analog converter 308, theresistive digital-to-analog converter 310, and resistivedigital-to-analog converter 312 at manufacture. The switch 316switchably couples the output voltage 120 to the resistivedigital-to-analog converter 312.

The CTAT voltage generation circuit 306 includes one or more transistors332. In the illustrated implementation of the CTAT voltage generationcircuit 306, two transistors 332 are connected as diodes and connectedin series. Other implementations of the CTAT voltage generation circuit306 may include a different number of transistors 332. The outputvoltage 114 is received as input to the transistors 332 via the circuit334, so that the voltage of the output voltage 118 is about two diodedrop voltages above ground. The output voltage 118 is provided at aninput terminal of the transistors 332 coupled to the circuit 334.

The output voltage 118 generated by the CTAT voltage generation circuit306 is provided to the resistive digital-to-analog converter 308. Theresistive digital-to-analog converter 308 operates as a programmablevoltage divider to generate a scaled version of the output voltage 118.The output voltage 122 generated by the resistive digital-to-analogconverter 308 is provided to the resistive digital-to-analog converter312. The switch 318 switchably couples the output voltage 122 to theresistive digital-to-analog converter 312.

The resistive digital-to-analog converter 312 operates as a programmablevoltage divider to produce a weighted sum of the output voltage 120 andthe output voltage 122. The switch 314 switchably couples the outputvoltage 124 produced by the resistive digital-to-analog converter 312 tothe bandgap circuit 302. The output voltage 124 is summed with theadjusted bandgap voltage produced by the bandgap circuit 302 to providetemperature compensation.

FIG. 4 shows a schematic diagram for a voltage reference circuit 400that includes voltage output temperature compensation implementedexternal to a control loop of the bandgap circuit in accordance with thepresent disclosure. The voltage reference circuit 400 is animplementation of the voltage reference circuit 100. The voltagereference circuit 400 includes bandgap circuit 402, a PTAT voltagegeneration circuit 404, a CTAT voltage generation circuit 406, aresistive digital-to-analog converter 408, resistive digital-to-analogconverter resistive digital-to-analog converter 410, and a resistivedigital-to-analog converter resistive digital-to-analog converter 412.The bandgap circuit 402, the PTAT voltage generation circuit 404, theCTAT voltage generation circuit 406, the resistive digital-to-analogconverter 408, the resistive digital-to-analog converter 410, and theresistive digital-to-analog converter 412 are implementations of thebandgap circuit 102, the PTAT voltage generation circuit 104, the CTATvoltage generation circuit 106, the resistive digital-to-analogconverter 108, the resistive digital-to-analog converter 110, and theresistive digital-to-analog converter 112 respectively.

The bandgap circuit 402 generates the bandgap voltage, and someimplementations include circuitry similar to the bandgap referencecircuit 320, the buffer amplifier 322, and/or the resistivedigital-to-analog converter 326. In the voltage reference circuit 400,the temperature compensation circuit does not provide feedback to thebandgap circuit 402, so the output voltage 414 generated by the bandgapcircuit 402 is not temperature compensated within the bandgap circuit402. The output voltage 414 is adjusted to equal a reference voltage ata selected temperature.

The PTAT voltage generation circuit 404 includes one or more transistors428. In the illustrated implementation of the PTAT voltage generationcircuit 404, a single transistor 428 is provided, so that the voltage ofthe output voltage 116 is about one diode drop voltage lower than thevoltage of the output voltage 414. Other implementations of the PTATvoltage generation circuit 404 may include a different number oftransistors 428. The output voltage 414 is received as input to thetransistor 428. The output voltage 116 is provided at an output terminalof the transistor 428.

The output voltage 116 generated by the PTAT voltage generation circuit404 is provided to the resistive digital-to-analog converter 410. Theresistive digital-to-analog converter 410 operates as a programmablevoltage divider to generate a scaled version of the output voltage 116.The output voltage 120 generated by the resistive digital-to-analogconverter 410 is provided to the resistive digital-to-analog converter412.

The CTAT voltage generation circuit 406 includes one or more transistors432. In the illustrated implementation of the CTAT voltage generationcircuit 406, two transistors 432 are connected as diodes and connectedin series. Other implementations of the CTAT voltage generation circuit406 may include a different number of transistors 432.

In the voltage reference circuit 400, the output voltage 414 is receivedby the resistive digital-to-analog converter 408, and provided to theCTAT voltage generation circuit 406 via the resistive digital-to-analogconverter 408. The output voltage 118 is about two diode voltage dropsabove ground, so the voltage across the resistive digital-to-analogconverter 408 is approximately the voltage of the output voltage 414less two diode voltage drops.

The resistive digital-to-analog converter 308 operates as a programmablevoltage divider to generate an output voltage 422 between the outputvoltage 118 and the output voltage 414. The output voltage 422 generatedby the resistive digital-to-analog converter 408 is provided to theresistive digital-to-analog converter 412.

The resistive digital-to-analog converter 412 operates as a programmablevoltage divider to produce a weighted sum of the output voltage 120 andthe output voltage 422. The output voltage 424 produced by the resistivedigital-to-analog converter 412 is provided to the buffer amplifier 440.The buffer amplifier 440 applies a selected gain to the output voltage424 to produce the output reference voltage 442.

FIG. 5 shows a flow diagram for a method 500 for trimming a voltagereference circuit that includes voltage output temperature compensationin accordance with the present disclosure. Though depicted sequentiallyas a matter of convenience, at least some of the actions shown can beperformed in a different order and/or performed in parallel.Additionally, some implementations may perform only some of the actionsshown. In some implementations, at least some of the operations of themethod 500 can be implemented by the voltage reference circuit voltagereference circuit 300.

In block 502, the voltage reference circuit 300 is being trimmed fortemperature compensation. For example, the process of manufacturing thevoltage reference circuit 300 includes the method 500 to trim thevoltage reference circuit 300 for temperature compensation. To adjustthe temperature compensation, the voltage reference circuit 300 is setto a first trim temperature. For example, the temperature of the voltagereference circuit 300 may be raised to 90 degrees Celsius. Thetemperature of the voltage reference circuit 300 may be set to adifferent value in some implementations.

In block 504, the switch 314, the switch 316, and the switch 318 are setto perform a bandgap accuracy trim. For example, the switch 314 isopened to isolate the bandgap circuit 302 from the resistivedigital-to-analog converter 312.

In block 506, the output voltage 114 generated by the bandgap circuit302 is compared to a reference voltage, and is adjusted to make theoutput voltage 114 equal to the reference voltage. The output voltage114 is adjusted by selecting a tap point of the resistivedigital-to-analog converter 326 at which the bandgap current 336provided to the resistive digital-to-analog converter 326 produces anoutput voltage 114 equaling the reference voltage. For example, a binarysearch of the taps of the resistive digital-to-analog converter 326 isperformed to identify the tap that produces a value of the outputvoltage 114 that best corresponds to the reference voltage.

In block 508, the switch 314, the switch 316, and the switch 318 are setto trim the output voltage 120 (the PTAT voltage) in the resistivedigital-to-analog converter 310. For example, the switch 314 is closed,the switch 316 is closed, and the switch 318 is opened to connect theoutput of the resistive digital-to-analog converter 310 to the bandgapcircuit 302, and disconnect the output of the resistivedigital-to-analog converter 308 from the bandgap circuit 302.

In block 510, feedback signal generated by the PTAT voltage generationcircuit 304 and scaled by the resistive digital-to-analog converter 310is provided to the bandgap circuit 302. The output voltage 114 generatedby the bandgap circuit 302 is compared to the reference voltage, and theoutput voltage 120 produced by the resistive digital-to-analog converter310 is adjusted to make the output voltage 114 equal to the referencevoltage. The resistive digital-to-analog converter 310 is adjusted byselecting a tap point of the resistive digital-to-analog converter 310at which the output voltage 120 provided to the resistivedigital-to-analog converter 312 results in the output voltage 114equaling the reference voltage. For example, a binary search of the tapsof the resistive digital-to-analog converter 310 is performed toidentify the tap that produces a value of the output voltage 114 thatbest corresponds to the reference voltage.

In block 512, the switch 314, the switch 316, and the switch 318 are setto trim the output voltage 122 (the CTAT voltage). For example, theswitch 314 is closed, the switch 316 is opened, and the switch 318 isclosed to connect the output of the resistive digital-to-analogconverter 308 to the bandgap circuit 302, and disconnect the output ofthe resistive digital-to-analog converter 310 from the bandgap circuit302.

In block 514, feedback signal generated by the CTAT voltage generationcircuit 306 and scaled by the resistive digital-to-analog converter 308is provided to the bandgap circuit 302. The output voltage 114 generatedby the bandgap circuit 302 is compared to the reference voltage, and theoutput voltage 122 produced by the resistive digital-to-analog converter308 is adjusted to make the output voltage 114 equal to the referencevoltage. The resistive digital-to-analog converter 308 is adjusted byselecting a tap point of the resistive digital-to-analog converter 308at which the output voltage 122 provided to the resistivedigital-to-analog converter 312 results in the output voltage 114equaling the reference voltage. For example, a binary search of the tapsof the resistive digital-to-analog converter 308 is performed toidentify the tap that produces a value of the output voltage 114 thatbest corresponds to the reference voltage.

The adjustments of the blocks 506, 510, and 514 are performed with thevoltage reference circuit 300 at the first trim temperature. In block516, the voltage reference circuit 300 is set to a second trimtemperature. For example, the temperature of the voltage referencecircuit 300 may be lowered to 25 degrees Celsius. The temperature of thevoltage reference circuit 300 may be set to a different value in someimplementations.

In block 518, the switch 314, the switch 316, and the switch 318 are setto trim the slope of the output voltage 124 (e.g., to set the rate ofchange of the output voltage 124 with temperature). For example, theswitch 314 is closed, the switch 316 is closed, and the switch 318 isclosed to connect the output of the resistive digital-to-analogconverter 308 and the output of the resistive digital-to-analogconverter 310 to the bandgap circuit 302.

In block 520, feedback signal generated by the CTAT voltage generationcircuit 306 (as scaled by the resistive digital-to-analog converter 308)and feedback signal generated by the PTAT voltage generation circuit 304(as scaled by the resistive digital-to-analog converter 310) is summedby the resistive digital-to-analog converter 312 and provided to thebandgap circuit 302. The weighting of the output voltage 120 and theoutput voltage 122 is set by selecting a tap of the resistivedigital-to-analog converter 312 that causes the output voltage 114 toequal the reference voltage. The output voltage 114 generated by thebandgap circuit 302 is compared to the reference voltage, and the outputvoltage 124 produced by the resistive digital-to-analog converter 312 isadjusted to make the output voltage 114 equal to the reference voltage.The resistive digital-to-analog converter 312 is adjusted by selecting atap point of the resistive digital-to-analog converter 312 at which theoutput voltage 124 provided to the resistive digital-to-analog converter312 results in the output voltage 114 equaling the reference voltage.For example, a binary search of the taps of the resistivedigital-to-analog converter 312 is performed to identify the tap thatproduces a value of the output voltage 114 that best corresponds to thereference voltage.

While the temperature compensation circuitry disclosed herein has beengenerally described in the context of a voltage reference circuit, thetemperature compensation circuitry is applicable to a wide variety ofcircuits that experience drift with temperature. For example, animplementation of the temperature compensation circuitry disclosedherein may be included in an operational amplifier to correct for offsetdrift, or included in any circuit that includes a bandgap reference tocompensate for drift in the bandgap reference.

The above discussion is meant to be illustrative of the principles andvarious embodiments of the present invention. Numerous variations andmodifications will become apparent to those skilled in the art once theabove disclosure is fully appreciated. It is intended that the followingclaims be interpreted to embrace all such variations and modifications.

What is claimed is:
 1. A method for trimming a voltage referencecircuit, comprising: adjusting an output voltage of a bandgap circuit toa reference voltage at a first temperature; generating a temperaturecompensation voltage to adjust the output voltage as a function oftemperature, the generating comprising setting a first resistivedigital-to-analog converter to produce a weighted sum of a voltageproportional to absolute temperature and a voltage complementary toabsolute temperature; and providing the temperature compensation voltageto the bandgap circuit to adjust the output voltage.
 2. The method ofclaim 1, further comprising generating the voltage proportional toabsolute temperature as the output voltage less three diode dropvoltages.
 3. The method of claim 1, further comprising generating thevoltage complementary to absolute temperature as two diode dropvoltages.
 4. The method of claim 1, further comprising setting a secondresistive digital-to-analog converter to scale the voltage proportionalto absolute temperature to the reference voltage at the firsttemperature.
 5. The method of claim 4, further comprising opening aswitch disposed between the first resistive digital-to-analog converterand a third resistive digital-to-analog converter while setting thesecond resistive digital-to-analog converter.
 6. The method of claim 4,further comprising setting a third resistive digital-to-analog converterto scale the voltage complementary to absolute temperature to thereference voltage at the first temperature.
 7. The method of claim 6,further comprising opening a switch disposed between the first resistivedigital-to-analog converter and the second resistive digital-to-analogconverter while setting the third resistive digital-to-analog converter.8. The method of claim 1, further comprising opening a switch todisconnect the first resistive digital-to-analog converter from thebandgap circuit while adjusting the output voltage of the bandgapcircuit.